Electrical measurements
WT-85X 400 Lifetime scanner
- Method for the spacial measurement of bulk minority carrier recombination lifetime.
- Kelvin-probe for surfacepotential measurements.
- More information about the device.
Contact person Hele Savin / Elektronifysiikan laboratorio.
More information: Link to equipment list 
DLS-83D Deep Level Spectrometer (DLTS)
- Deep impurities in semiconductors.
- More information about the device.
Contact person Hele Savin / Elektronifysiikan laboratorio.
More information: Link to equipment list 
Hall-measurement system + cryostat
- T range 8 K - 300 K
- Semiconductor carrier concentration and mobility as a function of temperature and magnetic field (max. 1.3 T).
- More information about the device.
Contact persons: Sergey Novikov ja Heikki Holmberg / Elektronifysiikan laboratorio.
More information: Link to equipment list
Probe-station
- I-V and C-V measurements for semiconductor devices.
- HP4155A Semiconductor parameter analyser and HP4192A LF impedance analyser.
Contact person Antti Haarahiltunen / Elektronifysiikan laboratorio.
More information: Link to equipment list
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