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P.O. Box 3500
FI-02015 TKK, FINLAND

Tel: +358-9-451 6068 (Director)
Fax: +358-9-451 3164
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02150 Espoo
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UMK | Uusien materiaalien keskus | Center for New Materials

X-ray instruments

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SAXS

Bruker NanoStar SAXS

Small-Angle-X-ray-Scattering.

  • Bruker NanoStar micro-focus Rotating anode.
  • Bruker Hi-Star 2D detector 1024*1024 pix.
  • Sample to Detector distance: 10 cm - 600 cm (800 cm). Corresponding crystal lattice size 0.3 nm upto 500 nm.
  • Fully automatic sample robotics (60 samples) . Samples either in vacuum, air or nitrogen etc..
  • Heating/cooling possibility (also multiple samples). In-situ rheology/SAXS.
  • Later available GISAXS for thin films.

Contact person Janne Ruokolainen / Optiikka ja molekyylimateriaalit.

More information: omm.hut.fi




XRD

PANalytical X'Pert PRO MRD

High resolution x-ray diffraction system.

  • Cu x-ray tube. (1-7 crystals).
  • Applications:
      • Texture analysis
      • Stress analysis
      • Thin film analysis, XRR (Thickness and surface roughness)
      • Crystalstructure analysis
  • max 6" wafer.

Contact person Pasi Kostamo / Optoelektroniikan laboratorio.

More information: atomi.hut.fi/facilities.php




XRAY

Fein-Focus FXS-160.24 Transmission x-ray

  • Voltage range: 10-160 kV.
  • Current range: 0.01-1 mA.
  • Magnification (geometrical) 1000x, Total 2200x.
  • Detail detectability < 2 μm.

Contact person doc. Kari Lounatmaa / Elektroniikan valmistustekniikan laboratorio.

More information: www.ept.hut.fi/Facilities



Last update 1.12.2008 | Content by UMK

Takomo